EMV CCP - PICC analog test suite EMV CCP_PICC analog test suite EMV CCP
EMVCo - PICCアナログテスト仕様概要
PICC analog test suite EMV CCP
This “Analog debug test suite” is based on a proprietary test plan and allows debugging your card based
on EMV CCP functional tests. This analog test suite is compatible with the following tests:
3 Radio Frequency Power and Signal Interface
3.2 RF Power
3.2.2 PICC Requirements for Power Transfer PCD to PICC
3.2.3 Influence of the PICC on the Operating Field
3.2.5 PICC Requirements for the Carrier Frequency fc
3.2.7 PICC Requirements for Power-off
3.2.8 PICC Requirements for Power-on
3.3 Signal Interface PCD to PICC
3.3.1 Introduction
3.3.3 PICC Requirements for Modulation PCD to PICC – Type A.
3.3.5 PICC Requirements for Modulation PCD to PICC – Type B
3.4 Signal Interface PICC to PCD
3.4.1 Introduction
3.4.2 PICC Requirements for Load Modulation
3.4.3 PICC Requirements for Subcarrier Modulation – Type A.
3.4.4 PICC Requirements for Subcarrier Modulation – Type B
2.7 PICC Digital test suite EMV CCP
This “Digital debug test suite” is based on a proprietary test plan and allows debugging on your card
based on EMV CCP functional tests. All the tests are described in an pdf document available in the RAR
file.
EMVCo - PICCアナログテスト対応
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