EMV CCP - PICC analog test suite EMV CCP_PICC analog test suite EMV CCP

EMVCo - PICCアナログテスト仕様概要

 PICC analog test suite EMV CCP

This “Analog debug test suite” is based on a proprietary test plan and allows debugging your card based
on EMV CCP functional tests. This analog test suite is compatible with the following tests:

3 Radio Frequency Power and Signal Interface
3.2 RF Power
3.2.2 PICC Requirements for Power Transfer PCD to PICC
3.2.3 Influence of the PICC on the Operating Field
3.2.5 PICC Requirements for the Carrier Frequency fc
3.2.7 PICC Requirements for Power-off
3.2.8 PICC Requirements for Power-on
3.3 Signal Interface PCD to PICC
3.3.1 Introduction
3.3.3 PICC Requirements for Modulation PCD to PICC – Type A.
3.3.5 PICC Requirements for Modulation PCD to PICC – Type B
3.4 Signal Interface PICC to PCD
3.4.1 Introduction
3.4.2 PICC Requirements for Load Modulation
3.4.3 PICC Requirements for Subcarrier Modulation – Type A.
3.4.4 PICC Requirements for Subcarrier Modulation – Type B

2.7 PICC Digital test suite EMV CCP

This “Digital debug test suite” is based on a proprietary test plan and allows debugging on your card
based on EMV CCP functional tests. All the tests are described in an pdf document available in the RAR
file.

EMVCo - PICCアナログテスト対応

• EMVCoのPICCアナログテスト内容が更新追加変更がある場合、そのための対応をしていきます。
• 詳細は、問い合わせください。

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NFC FORUM digital test suite Summary

NFC FORUM digital test suite is based on:

•   Test Cases for Digital Protocol
•   1st Wave of Certification NFC ForumTM
•   Test Cases For Digital Protocol–1stWaveOfCertification - 2011-02-20

NFC Digital test suite is compatible with the following tests:

3.2 Group 2: NFC Forum Device in Poll Mode

3.2.1 Group 2.1: Installation of NFC Forum Device with technology NFC-A

3.2.2 Group 2.2: Installation of NFC Forum Device with technology NFC-B

3.2.3 Group 2.3: Installation of NFC Forum Device with technology NFC-F

3.2.4 Group 2.4: Type 1 Tag (T1T) Platform

3.2.5 Group 2.5: Type 2 Tag (T2T) Platform

3.2.6 Group 2.6: Type 3 Tag (T3T) Platform

3.2.7 Group 2.7: Type 4A Tag (T4AT) Platform

3.2.8 Group 2.8: Type 4B Tag (T4BT) Platform

3.2.9 Group 2.9: Peer2Peer with NFC-A

3.2.10 Group 2.10: Peer2Peer with NFC-F

3.3 Group 3: NFC Forum Device in Listen Mode

3.3.1 Group 3.1: Installation of NFC Forum Device with technology NFC-A

3.3.2 Group 3.2: Installation of NFC Forum Device with technology NFC-B

3.3.3 Group 3.4: Type 3 Tag (T3T) Platform

3.3.4 Group 3.5: Type 4A Tag (T4AT) and Type 4B Tag (T4BT) Platform

3.3.5 Group 3.7: Peer2Peer with NFC-A

3.3.6 Group 3.8: Peer2Peer with NFC-F

• NFCフォーラム準拠のデジタル仕様のテストスイートは、NFCフォーラムでの追加修正変更がある場合、対応します。
• NFCフォーラム準拠の点で、ご不明な点がございましたら、お問い合わせください。

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NFC FORUM analog test suite Summary

NFC FORUM analog test suite is based on: 

• Test Specifications / Cases for the NFC RF Analog Specification
• NFC ForumTM – TWG - Draft 20

NFC FORUM analog test suite is compatible with the following tests:

9.1 GROUP 1: LISTENINGDEVICE TEST CASES
9.1.1GROUP 1.1: RADIO FREQUENCY POWER AND SIGNALINTERFACE
9.1.1.1 POWER RECEPTION TEST FOR NFC-A AT MINIMUM CONDITIONS
9.1.1.2 POWER RECEPTION TEST FOR NFC-A AT NOMINAL CONDITIONS
9.1.1.3 POWER RECEPTION TEST FOR NFC-A AT MAXIMUM CONDITIONS
9.1.1.4 POWER RECEPTION TEST FOR NFC-B AT MINIMUM CONDITIONS
9.1.1.5 POWER RECEPTION TEST FOR NFC-B AT NOMINAL CONDITIONS
9.1.1.6 POWER RECEPTION TEST FOR NFC-B AT MAXIMUM CONDITIONS
9.1.1.7 POWER RECEPTION TEST FOR NFC-F AT MINIMUM CONDITIONS
9.1.1.8 POWER RECEPTION TEST FOR NFC-F AT NOMINAL CONDITIONS
9.1.1.9 POWER RECEPTION TEST FOR NFC-F AT MAXIMUM CONDITIONS
9.1.1.10 LOADING EFFECT MEASUREMENT
9.1.1.11 CARRIER FREQUENCY TEST
9.1.1.12 POWER ON TEST FOR NFC-A.
9.1.1.13 POWER ON TEST FOR NFC-B
9.1.1.14 POWER ON TEST FOR NFC-F
9.1.1.15 POWER OFF TEST FOR NFC-A.
9.1.1.16 POWER OFF TEST FOR NFC-B
9.1.1.17 POWER OFF TEST FOR NFC-F
9.1.2GROUP 1.2: SIGNALINTERFACE POLLINGDEVICE TO LISTENINGDEVICE
9.1.2.1 MODULATION POLLING DEVICE TO LISTENING DEVICE AT LIMIT CONDITIONS– NFC-A
9.1.2.2 MODULATION POLLING DEVICE TO LISTENING DEVICE AT LIMIT CONDITIONS– NFC-B
9.1.2.3 MODULATION POLLING DEVICE TO LISTENING DEVICE AT LIMIT CONDITIONS– NFC-F
9.1.3GROUP 1.3: SIGNALINTERFACE LISTENINGDEVICE TO POLLINGDEVICE
9.1.3.1 LOAD MODULATION AMPLITUDE FOR NFC-A
9.1.3.2 LOAD MODULATION AMPLITUDE FOR NFC-B
9.1.3.3 LOAD MODULATION AMPLITUDE FOR NFC-F
9.1.3.4 SUBCARRIER MODULATION – NFC-A
9.1.3.5 SUBCARRIER MODULATION – NFC-B
9.2 GROUP 2:POLLINGDEVICE TEST CASES
9.2.1GROUP 2.1: RADIO FREQUENCY POWER AND SIGNALINTERFACE
9.2.1.1 MINIMUM POWER EMISSION MEASUREMENT
9.2.1.2 MAXIMUM POWER EMISSION MEASUREMENT
9.2.1.3 CARRIER FREQUENCY MEASUREMENT
9.2.1.4 RESET CHARACTERISTICS MEASUREMENT
9.2.1.5 THRESHOLD LEVEL TEST
9.2.2 GROUP 2.2:SIGNAL INTERFACE POLLING DEVICE TO LISTENING DEVICE
9.2.2.1 MODULATION POLLING DEVICE TO LISTENING DEVICE – NFC-A
9.2.2.2 MODULATION POLLING DEVICE TO LISTENING DEVICE – NFC-B
9.2.2.3 MODULATION POLLING DEVICE TO LISTENING DEVICE – NFC-F
9.2.3 GROUP 2.3:SIGNAL INTERFACE LISTENING DEVICE TO POLLING DEVICE
9.2.3.1 LOAD MODULATION SENSITIVITY TEST FOR NFC-A.
9.2.3.2 LOAD MODULATION SENSITIVITY TEST FOR NFC-B
9.2.3.3 LOAD MODULATION SENSITIVITY TEST FOR NFC-F

• NFCフォーラム仕様がアップデートした場合、そのテストをアップデートしていきます。
• 不明な点がございましたら、どうぞ、お尋ねください。

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NFC forum Digital test for Soliatis Compliance Test Solution

NFCフォーラム準拠デジタル・コンプライアンス・テスト

NFCフォーラム仕様の« デジタル »部分を検証するテストスイートを提供します。このテストスイートには、ポーラーとリスナーの両方のモードでNFCフォーラムのデバイスに適用されます。

NFCフォーラム準拠デジタル・コンプライアンス・テスト仕様

NFCフォーラムでのテスト仕様書で定義されているテストスクリプト(詳細概要はこちら）：

•  Test Cases for Digital Protocol
•  1st Wave of Certification NFC ForumTM
•  Test Cases For Digital Protocol–1stWaveOfCertification - 2011-02-20

NFCフォーラム準拠オープンテストスイート

• SCRIPTISフレームワーク(UI）を準備
• NFCフォーラム準拠アナログ・テストプログラムを準備
• ユーザ・ロジックをテストプログラムに追加修正可能
• 分析結果とテストレポートが自動的に生成

NFCフォーラム準拠デジタル・コンプライアンス・テストのハードウエア環境

• ホストPC(Windows7 64bit/32bit、WindowsXP対応）
• ProxiLAB（NFCシングルプロトコルアナライザ/NFCテスタ）
• NFC Forumフォーラム準拠アンテナ（Poller及びListener)

NFCとは何ですか？

近距離通信（NFC）技術は、より単純で、取引を行う交換、デジタルコンテンツおよびタッチで電子機器を接続するために行うことで、世界中の消費者の生活をより簡単かつ便利になります。